SEM/EDS Analysis
Airborne Particulate Analysis provides the ability to characterize airborne particulates using SEM (Scanning Electron Microscope)/EDS (Energy Dispersive X-Ray Spectrometer) technology. With SEM/EDS analysis, we can evaluate surfaces, particles, materials, etc. down to 0.01µm and can determine the nature of particulate, the source for contamination, and the source for fallout. In addition to being able to see feature morphology, it is possible to use the EDS to determine the elemental makeup of minute features. The EDS can detect elements with the atomic number of carbon or higher.

A Ph.D. Analytical Chemist and an SEM/EDS specialist team up to apply over 40 years of collective analytical experience to solving your specific problem. Before beginning work, each application is critically reviewed with the submitter to ensure that Prism’s team of scientists fully understands the nature of the request. Then, as work progresses, communication between Prism’s team and the submitter continues until the problem is resolved.

Call us to talk to an IH or Chemical Specialist: 989-772-5088